ATmet: Advanced Tools for Metrology
A collection of functions for smart sampling and sensitivity analysis for metrology applications, including computationally expensive problems.
Version: |
1.2.1 |
Depends: |
R (≥ 2.7.0), DiceDesign, lhs, metRology, msm, sensitivity |
Published: |
2020-05-06 |
Author: |
Severine Demeyer and Alexandre Allard, with contributions from Bertrand Iooss |
Maintainer: |
Alexandre Allard <alexandre.allard at lne.fr> |
License: |
GPL-3 |
NeedsCompilation: |
no |
In views: |
ChemPhys |
CRAN checks: |
ATmet results |
Documentation:
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